Repozytorium IFJ PAN

Book of Abstracts, Focused Charged Particle Beam Week

Show simple item record Wolny-Marszałek, Marta 2022-10-21T06:19:44Z 2022-10-21T06:19:44Z 2022
dc.description.abstract A Focused Ion Beam (FIB) provides the unique possibilities to create new functionality in materials on the nanometer scale as well as to characterize such materials on the relevant length scale of a few nanometers. This can be applied to a wide number of materials covering many research fields such as the semiconductor industry, health, raw materials, quantum materials, 2D materials and optically active materials and devices, etc. pl_PL.UTF-8
dc.language.iso eng pl_PL.UTF-8
dc.publisher Institute of Nuclear Physics Polish Academy of Sciences pl_PL.UTF-8
dc.rights Uznanie autorstwa 4.0 Międzynarodowe *
dc.rights.uri *
dc.title Book of Abstracts, Focused Charged Particle Beam Week pl_PL.UTF-8
dc.type conferenceObject pl_PL.UTF-8

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Uznanie autorstwa 4.0 Międzynarodowe Except where otherwise noted, this item's license is described as Uznanie autorstwa 4.0 Międzynarodowe