Book of Abstracts, Focused Charged Particle Beam Week

dc.contributor.author	Wolny-Marszałek, Marta
dc.date.accessioned	2022-10-21T06:19:44Z
dc.date.available	2022-10-21T06:19:44Z
dc.date.issued	2022
dc.identifier.uri	http://rifj.ifj.edu.pl/handle/item/377
dc.description.abstract	A Focused Ion Beam (FIB) provides the unique possibilities to create new functionality in materials on the nanometer scale as well as to characterize such materials on the relevant length scale of a few nanometers. This can be applied to a wide number of materials covering many research fields such as the semiconductor industry, health, raw materials, quantum materials, 2D materials and optically active materials and devices, etc.	pl_PL.UTF-8
dc.language.iso	eng	pl_PL.UTF-8
dc.publisher	Institute of Nuclear Physics Polish Academy of Sciences	pl_PL.UTF-8
dc.rights	Uznanie autorstwa 4.0 Międzynarodowe	*
dc.rights.uri	http://creativecommons.org/licenses/by/4.0/	*
dc.title	Book of Abstracts, Focused Charged Particle Beam Week	pl_PL.UTF-8
dc.type	conferenceObject	pl_PL.UTF-8