Book of Abstracts, Focused Charged Particle Beam Week
| dc.contributor.author | Wolny-MarszaĆek, Marta | |
| dc.date.accessioned | 2022-10-21T06:19:44Z | |
| dc.date.available | 2022-10-21T06:19:44Z | |
| dc.date.issued | 2022 | |
| dc.description.abstract | A Focused Ion Beam (FIB) provides the unique possibilities to create new functionality in materials on the nanometer scale as well as to characterize such materials on the relevant length scale of a few nanometers. This can be applied to a wide number of materials covering many research fields such as the semiconductor industry, health, raw materials, quantum materials, 2D materials and optically active materials and devices, etc. | pl_PL.UTF-8 |
| dc.identifier.uri | http://rifj.ifj.edu.pl/handle/item/377 | |
| dc.language.iso | eng | pl_PL.UTF-8 |
| dc.publisher | Institute of Nuclear Physics Polish Academy of Sciences | pl_PL.UTF-8 |
| dc.rights | Uznanie autorstwa 4.0 MiÄdzynarodowe | * |
| dc.rights.uri | http://creativecommons.org/licenses/by/4.0/ | * |
| dc.title | Book of Abstracts, Focused Charged Particle Beam Week | pl_PL.UTF-8 |
| dc.type | conferenceObject | pl_PL.UTF-8 |
